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Silicon wafer AOI equipment

Product Introduction

Bright-field and dark-field wafer surface inspection using high-resolution imaging  based on three modes: image algorithm, detection model and anomaly detection, and provides statistical analysis.

2D Inspection accuracy
um

1

UPH
pcs/h

60

Escape
ppm

≤50

1xBET(中国)官方网站-登录入口

1xBET(中国)官方网站-登录入口